Holdings: Fourier transform infrared spectrometry

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Bibliographic Details
Title:	Fourier transform infrared spectrometry
From:	Peter R. Griffiths ; James A. De Haseth
Person:	Griffiths, Peter R. Verfasser aut DeHaseth, James A.
Main Authors:	Griffiths, Peter R. (Author), DeHaseth, James A. (Author)
Format:	Book
Language:	English
Published:	New York <<[u.a.]>> Wiley 2007
Edition:	2. ed.
Series:	Chemical analysis 171
Notation:	VG 9200
Subjects:	FT-IR-Spektroskopie Infrarotspektroskopie Fourier-Transformation Fourier-Spektroskopie
Online Access:	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018334459&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
Physical Description:	XIII, 529 S. graph. Darst.
ISBN:	0471099023

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MARC


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Record in the Search Index

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adam_text	* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * ***** * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * ******* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * ******* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * **** * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * ******* * * * * * * * * * * * * * * * * ******* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * V VI CONTENTS CHAPTER 3 SAMPLING THE INTERFEROGRAM 57* 3.1. SAMPLING FREQUENCY 57* 3.1.1. NYQUIST FREQUENCY 57* 3.1.2. CONCEPTUAL DISCUSSION OF ALIASING 58* 3.1.3. MATHEMATICAL DISCUSSION OF ALIASING 60* 3.2. ALIASING 62* 3.3. DYNAMIC RANGE 64* 3.3.1. ADC SPECIFICATIONS 64* 3.3.2. DIGITIZATION NOISE 66* 3.3.3. GAIN RANGING 68* 3.3.4. CHIRPING 69* 3.4. ANALOG-TO-DIGITAL CONVERTERS 71* CHAPTER 4 FOURIER TRANSFORMS 75* 4.1. CLASSICAL FOURIER TRANSFORM 75* 4.1.1. ELEMENTARY CONCEPTS 75* 4.1.2. MATHEMATICAL BASIS 76* 4.2. FAST FOURIER TRANSFORM 78* 4.3. PHASE CORRECTION 85* 4.4. FOURIER TRANSFORM: PICTORIAL ESSAY 88* 4.5. DATA SYSTEMS 93* CHAPTER 5 TWO-BEAM INTERFEROMETERS 97* 5.1.* MICHELSON-TYPE INTERFEROMETERS 97* 5.2.* TILT-COMPENSATED INTERFEROMETERS 112* 5.3.* REFRACTIVELY SCANNED INTERFEROMETERS 123* 5.4.* POLARIZATION INTERFEROMETERS 125* 5.5.* STEP-SCAN INTERFEROMETERS 127* 5.6.* STATIONARY INTERFEROMETERS 128* 5.7.* BEAMSPLITTERS 132* 5.1.1. INTRODUCTION 97* 5.1.2. DRIVE 97* 5.1.3. BEARINGS 98* 5.1.4. FRINGE REFERENCING 104* 5.1.5. DYNAMIC ALIGNMENT 110* 5.2.1. CUBE-CORNER INTERFEROMETERS 112* 5.2.2. OTHER DESIGNS 118* CONTENTS* VII* 5.8. LAMELLAR GRATING INTERFEROMETERS 138* APPENDIX: MANUFACTURERS OF FR-IR SPECTROMETERS 142* CHAPTER 6* OTHER COMPONENTS OF FT-IR* SPECTROMETERS 143* 6.1.* INFRARED RADIATION SOURCES FOR TRANSMISSION* AND REFLECTION SPECTROMETRY 143* 6.1.1.* MID-INFRARED SOURCES 143* 6.1.2.* NEAR-INFRARED SOURCES 145* 6.1.3.* FAR-INFRARED SOURCES 146* 6.2.* DETECTORS 146* 6.2.1.* THERMAL DETECTORS 146* 6.2.2.* QUANTUM DETECTORS 148* 6.3.* OPTICS 152* 6.3.1.* PARABOLOIDAL MIRRORS 152* 6.3.2.* PLANE MIRRORS 155* 6.3.3.* ELLIPSOIDS, TOROIDS, AND OTHER* ASPHERICAL MIRRORS 155* 6.4.* SPECTROMETER DESIGN 156* CHAPTER 7* SIGNAL-TO-NOISE RATIO 161* 7.J.* DETECTOR NOISE 161* 7.2.* TRADING RULES IN FR-IR SPECTROMETRY 164* 7.2.1.* EFFECT OF RESOLUTION AND* THROUGHPUT ON SNR 164* 7.2.2.* EFFECT OF APODIZATION 165* 7.2.3.* EFFECT OF CHANGING MIRROR VELOCITY 165* 7.3.* DIGITIZATION NOISE 166* 7.4.* OTHER SOURCES OF NOISE 167* 7.4.1.* SAMPLING ERROR 167* 7.4.2.* FOLDING 168* 7.4.3.* FLUCTUATION NOISE 169* 7.4.4.* SHOT NOISE 170* 7.5.* INTERFEROMETERS VERSUS GRATING SPECTROMETERS 171* 7.5.1.* FELLGETT S ADVANTAGE 171* 7.5.2.* JACQUINOT S ADVANTAGE 172* 7.5.3.* OTHER FACTORS 173* VLLL* CONTENTS CHAPTER 8* PHOTOMETRIC ACCURACY IN* FT-IR SPECTROMETRY 177* S.I. LNTRODUCTION* 177* 8.2. EFFECT OF SPECTRAL RESOLUTION* 177* 8.3. EFFECT OF APODIZATION* 180* 8.3.1. TRIANGULAR APODIZATION* 180* 8.3.2. NORTON-BEER APODIZATION FUNCTIONS 181* 8.4. 100% LINES* ISI 8.4.1. SHORT-TERM PERFORMANCE* 181* 8.4.2. GLITCHES (NONRANDOM NOISE SOURCES) 184* 8.4.3. LONG- TERM PERFORMANCE* 185* 8.4.4. EFFECT OF SAMPIE DIAMETER AND THICKNESS 186* 8.5. ZERO ENERGY LEVEL* 187* 8.5.1. DETECTOR RESPONSE NONLINEARITY 187* 8.5.2. CHANGES IN MODULATION EFFICIENCY 191* 8.5.3. SAMPLING EFFECTS* 193* 8.6. LINEARITY BETWEEN 100% AND O%T* 194* CHAPTER 9* QUANTITATIVE ANALYSIS 197* 9. I. INTRODUCTION* 197* 9.2. BEER S LAW* 197* 9.3. SPECTRAL SUBTRACTION* 201* 9.4. LINEAR LEAST-SQUARES FITTING METHODS 204* 9.5. CLASSICAL LEAST SQUARES* 207* 9.6. INVERSE LEAST-SQUARES REGRESSION* 210* 9.7. PRINCIPAL COMPONENT ANALYSIS* 213* 9.8. PRINCIPAL COMPONENT REGRESSION* 215* 9.9. PARTIAL LEAST-SQUARES REGRESSION* 216* 9.10. VALIDATION* 217* 9.1 I. MULTIVARIATE CURVE RESOLUTION* 218* 9.12. GENERAL GUIDELINES FOR CALIBRATION DATA SETS 220* 9.13. NEURAL NETWORKS* 221* CHAPTER 10* DATA PROCESSING 225* 10.1. BASELINE CORRECTION* 225* 10.2. INTERPOLATION* 227* 10.3. PEAK PIEKING* 229* 10.4. SPECTRAL SMOOTHING* 232* CONTENTS* IX 10.5. BAND FITTING* 235* 10.6. DERIVATIVES OF SPECTRA* 237* 10.7. FOURIER SELF-DECONVOLUTION* 240* 10.8. SPECTRAL SEARCHING* 246* CHAPTER 11* CONVENTIONAL TRANSMISSION* SPECTROMETRY 251* 11.1. CONDENSED-PHASE SAMPIES* 251* 11.1.1 WINDOW MATERIALS* 251* 11.1.2 BAND INTENSITIES* 251* 11.1.3 INTERFERENCE FRINGES 253* I 1.1.4 TRACE ANALYSIS 255* 11.2. GAS- AND VAPOR-PHASE SAMPIES* 256* CHAPTER 12* POLARIZATION 261* 12.1. PLANE-POLARIZED RADIATION* 261* 12.2. CIRCULAR POLARIZATION* 263* 12.3. POLARIZATION MODULATION* 264* 12.4. APPLICATIONS OF LINEAR DICHROISM* 266* 12.5. VIBRATIONAL CIRCULAR DICHROISM* 269* CHAPTER 13* SPECULAR REFLECTION 277* 13. I. INTRODUCTION* 277* 13.2. FRESNEL REFTECTION FROM BULK SAMPIES 277* 13.2.1. FRESNEL EQUATIONS* 277* 13.2.2. NONABSORBING MATERIALS* 278* 13.2.3. ABSORBING MATERIALS* 279* 13.3. INFRARED REFTECTION-ABSORPTION SPECTROMETRY* WITH METAL SUBSTRATES 282* 13.3.1. EFFECT OF INCIDENCE ANGLE AND POLARIZATION 282* 13.3.2. POLARIZATION MODULATION* 287* 13.3.3. SURFACE SELECTION RULE* 290* 13.4. LRRAS WITH DIELECTRIC SUBSTRATES* 293* 13.5. TRANSFTECTION* 297* 13.5.1. THICK FILMS ON METAL SUBSTRATES 297* 13.5.2. LIQUID SAMPLING FOR NEAR-LNFRARED* SPECTROMETRY 300* 13.6. SUMMARY* 300* X CONTENTS CHAPTER 14 MICROSPECTROSCOPY AND IMAGING 303* 14.1. MICROSAMPLING WITH BEAM CONDENSERS 303* 14.2. MICROSEOPES 304* 14.3. DIAMOND ANVIL CELLS 309* 14.4. REFTECTION MICROSCOPY 310* 14.5. HYPERSPECTRAL FR-IR JMAGING 312* 14.5. I. HYPERSPECTRAL IMAGING WITH A* STEP-SCANNING INTERFEROMETER 312* 14.5.2. HYPERSPECTRAL IMAGING WITH A* CONTINUOUS-SCANNING INTERFEROMETER 314* 14.5.3. SIGNAL-TO-NOISE RATIO 316* 14.5.4. SOFTWARE 318* 14.5.5. APPLICATIONS OF HYPERSPECTRAL IMAGING 319* CHAPTER 15 ATTENUATED TOTAL REFLECTION 321* 15.1. INTRODUCTION 321* 15.2. THEORY 322* 15.3. PRACTICAL CONSIDERATIONS 327* 15.4. ACCESSORIES FOR MULTIPLE INTERNAL REFLECTION 329* 15.5. SINGLE-REFTECTION ACCESSORIES 336* 15.6. INFRARED FIBERS 342* 15.7. SUMMARY 347* CHAPTER 16 DIFFUSE REFLECTION 349* 16.1. THEORY OF DIFFUSE REFTECTION 349* 16.2. ACCESSORIES FOR DIFFUSE REFTECTION 353* 16.3. APPLICATIONS OF MID-INFRARED DIFFUSE* REFTECTION SPECTROMETRY 355* 16.4. APPLICATIONS OF NEAR-INFRARED DIFFUSE* REFLECTION SPECTROMETRY 358* 16.5. REFERENCE MATERIALS FOR DIFFUSE REFLECTION* SPECTROMETRY 361* CHAPTER 17 EMISSION 363* 17.1. INTRODUCTION 363* 17.2. INFRARED EMISSION SPECTRA OF GASES 363* CONTENTS* XI* 17.3. INFRARED EMISSION SPECTRA OF* CONDENSED-PHASE SAMPIES 366* 17.4. TRANSIENT INFRARED EMISSION SPECTROSCOPY 368* CHAPTER 18* FOURIER TRANSFORM RAMAN* SPECTROMETRY 375* 18.1. INTRODUCTION* 375* 18.2. INSTRUMENTATION* 378* 18.2.1. ND: YAG LASER* 378* 18.2.2. FILTERS* 380* 18.2.3. COLLECTION OPTICS* 381* 18.2.4. INTERFEROMETER* 382* 18.2.5. DETECTOR* 382* 18.2.6. SPECTROMETER* 384* 18.3. FT RAMAN VERSUS CCD RAMAN SPECTROMETRY 385* 18.4. APPLICATIONS OF FT-RAMAN SPECTROMETRY 387* 18.4.1. STANDARD RAMAN SPECTROSCOPY 387* 18.4.2. SURFACE-ENHANCED RAMAN SPECTROSCOPY 389* 18.5. SUMMARY* 391* CHAPTER 19* TLME-RESOLVED SPECTROMETRY 395* 19.1. CONTINUOUS-SCANNING INTERFEROMETERS 395* 19.1.1. INSTRUMENTAL CONSIDERATIONS* 395* 19.1.2. APPLICATIONS* 397* 19.2. TIME-RESOLVED MEASUREMENTS USING STEP-SCAN* INTERFEROMETERS 400* 19.2.1. INSTRUMENTAL CONSIDERATIONS* 400* 19.2.2. APPLICATIONS OF TIME-RESOLVED* SPECTROSCOPY WITH A STEP-SCAN* INTERFEROMETER 402* 19.3. STROBOSCOPIC SPECTROMETRY* 407* 19.4. ASYNCHRONOUS TIME-RESOLVED FT-IR* SPECTROMETRY 408* 19.4.1. INSTRUMENTAL CONSIDERATIONS* 408* 19.4.2. APPLICATION TO LIQUID-CRYSTAL* ORIENTATION DYNAMICS 412* XII* CONTENTS CHAPTER 20* PHOTOACOUSTIC SPECTROMETRY 415* 20.1.* PHOTOACOUSTIC SPECTROSCOPY OF GASES 415* 20.2.* PHOTOACOUSTIC SPECTROSCOPY OF SOLIDS WITH* A RAPID-SCANNING INTERFEROMETER 417* 20.3.* PHOTOACOUSTIC SPECTROSCOPY OF SOLIDS WITH* A STEP-SCAN INTERFEROMETER 425* 20.3.1. PHASE MODULATION* 425* 20.3.2. DEPTH PROFILING BY VARYING THE* PHOTOACOUSTIC PHASE 428* 20.3.3. MULTIFREQUENCY MEASUREMENTS 431* CHAPTER 21* SAMPLE MODULATION SPECTROMETRY* WITH A STEP-SCAN INTERFEROMETER 435* 21.1.* DYNAMIC INFRARED LINEAR DICHROISM MEASURED* WITH A MONOCHROMATOR 435* 21.2.* DIRLD SPECTROMETRY WITH A STEP-SCAN FOURIER* TRANSFORM SPECTROMETER 440* 21.3. TWO-DIMENSIONAL CORRELATION PLOTS* 448* 21.4.* DIRLD SPECTROMETRY WITH A FR-IR SPECTROMETERY* AND DIGITAL SIGNAL PROCESSING 454* 21.5.* OTHER SAMPIE MODULATION MEASUREMENTS* WITH STEP-SCAN INTERFEROMETERS 458* 21.5.1. LIQUID-CRYSTAL ELECTROREORIENTATION 458* 21.5.2. INFRARED SPECTROELECTROCHEMISTRY 460* CHAPTER 22* ATMOSPHERIC MONITORING 463* 22.1.* EXTRACTIVE ATMOSPHERIC MONITORING 463* 22.2.* OPEN-PATH ATMOSPHERIC MONITORING 466* CHAPTER 23* COUPLED TECHNIQUES 481* 23.1.* INTRODUCTION 481* 23.2.* LIGHT-PIPE-BASED GC/FF-IR INTERFACES 482* 23.2.1. INSTRUMENTAL CONSIDERATIONS* 482* 23.2.2. SPECTROSCOPIC CONSIDERATIONS 485* 23.2.3. CHROMATOGRAM CONSTRUCTION* 486* 23.2.4. EXAMP1E OF GC/FR-IR* 490* 23.3.* MOBILE-PHASE ELIMINATION APPROACHES* FOR GC/FR-IR 491* CONTENTS X 111 23.3.1. INTRODUCTION 491* 23.3.2. MATRIX ISOLATION GC/FR-IR 491* 23.3.3. DIRECT DEPOSITION GC/FT-LR 493* 23.4. HPLC/FT-IR INTERFACE 495* 23.4.1. MEASUREMENTS MADE WITH FLOW CELLS 495* 23.4.2. MOBILE-PHASE ELIMINATION TECHNIQUES* FOR HPLC/FT-IR 496* 23.5. SFC/FT-IR INTERFACE 500* 23.6. TGA/FT-IR 502* 23.7. OTHER COUPLED TECHNIQUES 504* INDEX 509*
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author	Griffiths, Peter R. DeHaseth, James A.
author_facet	Griffiths, Peter R. DeHaseth, James A.
author_role	aut aut
author_sort	Griffiths, Peter R.
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dewey-full	535.842
dewey-hundreds	500 - Natural sciences and mathematics
dewey-ones	535 - Light and related radiation
dewey-raw	535.842
dewey-search	535.842
dewey-sort	3535.842
dewey-tens	530 - Physics
discipline	Chemie / Pharmazie Physik
edition	2. ed.
format	Book
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id	DE-604.BV024117736
illustrated	Illustrated
indexdate	2024-12-20T13:53:42Z
institution	BVB
isbn	0471099023
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-018334459
oclc_num	254783254
open_access_boolean
owner	DE-83
owner_facet	DE-83
physical	XIII, 529 S. graph. Darst.
publishDate	2007
publishDateSearch	2007
publishDateSort	2007
publisher	Wiley
record_format	marc
series	Chemical analysis
series2	Chemical analysis
spellingShingle	Griffiths, Peter R. DeHaseth, James A. Fourier transform infrared spectrometry Chemical analysis FT-IR-Spektroskopie Infrarotspektroskopie (DE-588)4135411-4 gnd FT-IR-Spektroskopie (DE-588)4135416-3 gnd Fourier-Transformation (DE-588)4018014-1 gnd Fourier-Spektroskopie (DE-588)4135413-8 gnd
subject_GND	(DE-588)4135411-4 (DE-588)4135416-3 (DE-588)4018014-1 (DE-588)4135413-8
title	Fourier transform infrared spectrometry
title_auth	Fourier transform infrared spectrometry
title_exact_search	Fourier transform infrared spectrometry
title_full	Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth
title_fullStr	Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth
title_full_unstemmed	Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth
title_short	Fourier transform infrared spectrometry
title_sort	fourier transform infrared spectrometry
topic	FT-IR-Spektroskopie Infrarotspektroskopie (DE-588)4135411-4 gnd FT-IR-Spektroskopie (DE-588)4135416-3 gnd Fourier-Transformation (DE-588)4018014-1 gnd Fourier-Spektroskopie (DE-588)4135413-8 gnd
topic_facet	FT-IR-Spektroskopie Infrarotspektroskopie Fourier-Transformation Fourier-Spektroskopie
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018334459&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
volume_link	(DE-604)BV000008780
work_keys_str_mv	AT griffithspeterr fouriertransforminfraredspectrometry AT dehasethjamesa fouriertransforminfraredspectrometry

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