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Bibliographische Detailangaben
Titel:	Pattern recognition introduction, features, classifiers and principles
Von:	Jürgen Beyerer, Matthias Richter, Matthias Nagel
Person:	Beyerer, Jürgen 1961- Verfasser aut Richter, Matthias Nagel, Matthias
Hauptverfassende:	Beyerer, Jürgen 1961- (VerfasserIn), Richter, Matthias (VerfasserIn), Nagel, Matthias (VerfasserIn)
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	Berlin ; Boston De Gruyter [2018]
Schriftenreihe:	De Gruyter Graduate
Notation:	ST 330 ZN 6050
Schlagwörter:	Maschinelles Lernen Automation Mustererkennung Künstliche Intelligenz Data Mining Machine Learning Artificial Intelligence
Medienzugang:	http://www.degruyter.com/search?f_0=isbnissn&q_0=9783110537932&searchTitles=true
Umfang:	XXI, 283 Seiten Illustrationen, Diagramme
ISBN:	9783110537932

Internformat

MARC


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776	0	8	\|i Erscheint auch als \|n Online-Ausgabe, PDF \|z 978-3-11-053794-9
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Datensatz im Suchindex

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DE-BY-UBR_katkey	6032453
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DE-BY-UBR_media_number	TEMP12634393
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any_adam_object
author	Beyerer, Jürgen 1961- Richter, Matthias Nagel, Matthias
author_GND	(DE-588)114116733 (DE-588)1165106868 (DE-588)1021370711
author_facet	Beyerer, Jürgen 1961- Richter, Matthias Nagel, Matthias
author_role	aut aut aut
author_sort	Beyerer, Jürgen 1961-
author_variant	j b jb m r mr m n mn
building	Verbundindex
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classification_rvk	ST 330 ZN 6050
classification_tum	DAT 770f
ctrlnum	(OCoLC)1019999800 (DE-599)HBZHT019504970
dewey-full	621.3
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3
dewey-search	621.3
dewey-sort	3621.3
dewey-tens	620 - Engineering and allied operations
discipline	Informatik Elektrotechnik / Elektronik / Nachrichtentechnik
format	Book
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illustrated	Illustrated
indexdate	2024-12-20T18:09:32Z
institution	BVB
institution_GND	(DE-588)1065492103
isbn	9783110537932
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030103647
oclc_num	1019999800
open_access_boolean
owner	DE-91G DE-BY-TUM DE-92 DE-473 DE-BY-UBG DE-898 DE-BY-UBR DE-19 DE-BY-UBM DE-703 DE-1102 DE-29T DE-634 DE-355 DE-BY-UBR DE-83 DE-20
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physical	XXI, 283 Seiten Illustrationen, Diagramme
publishDate	2018
publishDateSearch	2018
publishDateSort	2018
publisher	De Gruyter
record_format	marc
series2	De Gruyter Graduate
spellingShingle	Beyerer, Jürgen 1961- Richter, Matthias Nagel, Matthias Pattern recognition introduction, features, classifiers and principles Maschinelles Lernen (DE-588)4193754-5 gnd Automation (DE-588)4003957-2 gnd Mustererkennung (DE-588)4040936-3 gnd Künstliche Intelligenz (DE-588)4033447-8 gnd Data Mining (DE-588)4428654-5 gnd
subject_GND	(DE-588)4193754-5 (DE-588)4003957-2 (DE-588)4040936-3 (DE-588)4033447-8 (DE-588)4428654-5
title	Pattern recognition introduction, features, classifiers and principles
title_auth	Pattern recognition introduction, features, classifiers and principles
title_exact_search	Pattern recognition introduction, features, classifiers and principles
title_full	Pattern recognition introduction, features, classifiers and principles Jürgen Beyerer, Matthias Richter, Matthias Nagel
title_fullStr	Pattern recognition introduction, features, classifiers and principles Jürgen Beyerer, Matthias Richter, Matthias Nagel
title_full_unstemmed	Pattern recognition introduction, features, classifiers and principles Jürgen Beyerer, Matthias Richter, Matthias Nagel
title_short	Pattern recognition
title_sort	pattern recognition introduction features classifiers and principles
title_sub	introduction, features, classifiers and principles
topic	Maschinelles Lernen (DE-588)4193754-5 gnd Automation (DE-588)4003957-2 gnd Mustererkennung (DE-588)4040936-3 gnd Künstliche Intelligenz (DE-588)4033447-8 gnd Data Mining (DE-588)4428654-5 gnd
topic_facet	Maschinelles Lernen Automation Mustererkennung Künstliche Intelligenz Data Mining
url	http://www.degruyter.com/search?f_0=isbnissn&q_0=9783110537932&searchTitles=true
work_keys_str_mv	AT beyererjurgen patternrecognitionintroductionfeaturesclassifiersandprinciples AT richtermatthias patternrecognitionintroductionfeaturesclassifiersandprinciples AT nagelmatthias patternrecognitionintroductionfeaturesclassifiersandprinciples AT degruyteroldenbourg patternrecognitionintroductionfeaturesclassifiersandprinciples

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